Testing Digital Circuits an Introduction / B.R Wilkins
Publisher: UK Van Nostrand Reinhold 1986Description: 196pSubject(s): Telecommunication EngineeringDDC classification: 621.38153,WIL
Contents:
Testing In Context (Page-1), Test-Pattern Generators (Page-21), Aids To Test Pattern Generators (Page-43), Faults Diagrams (Page-55), Testing Sequential Logic(Page-76), Testing MSI and LSI Devices (Page-97), Enhancing Testability (Page-122), Designing Of Testability (Page-139), Self-Testing Circuits (Page-158).
| Item type | Current location | Home library | Shelving location | Call number | URL | Status | Notes | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|---|---|
Book
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Military College of Signals (MCS) | Military College of Signals (MCS) | General Stacks | 621.38153,WIL (Browse shelf) | Link to resource | Available | Almirah No.34, Shelf No.3 | MCS5125 | ||
|
Book
|
Military College of Signals (MCS) | Military College of Signals (MCS) | General Stacks | 621.38153,WIL (Browse shelf) | Link to resource | Available | Almirah No.34, Shelf No.3 | MCS5126 | ||
|
Book
|
Military College of Signals (MCS) | Military College of Signals (MCS) | General Stacks | 621.38153,WIL (Browse shelf) | Link to resource | Available | Almirah No.34, Shelf No.3 | MCS5127 |
Total holds: 0
Testing In Context (Page-1), Test-Pattern Generators (Page-21), Aids To Test Pattern Generators (Page-43), Faults Diagrams (Page-55), Testing Sequential Logic(Page-76), Testing MSI and LSI Devices (Page-97), Enhancing Testability (Page-122), Designing Of Testability (Page-139), Self-Testing Circuits (Page-158).
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