Microwave noise in semiconductor devices / Hans Ludwig Hartnagel, Ramunas Katilius, Arvydas Matulionis.
Publisher: New York : Wiley, c2001Description: xviii, 293 p. : ill. ; 25 cmISBN: 0471384321 (cloth : alk. paper)Subject(s): Semiconductors | Telecommunication EngineeringDDC classification: 621.38133,HAR Online resources: Contributor biographical information | Publisher description | Table of Contents| Item type | Current location | Home library | Shelving location | Call number | URL | Status | Notes | Date due | Barcode | Item holds |
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Reference
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Military College of Signals (MCS) | Military College of Signals (MCS) | Reference | 621.38133,HAR (Browse shelf) | Link to resource | Not for loan | Almirah No.21, Shelf No.3 | MCS30725 |
Introduction (Page-1), Kinetic Theory of Nonequilibrium Processes (Page-16), Fluctuations: Kinetic Theory (Page-25), Effect of Interelectron Collisions on Fluctuation Phenomena (Page-37), Boltzmann-Langevin Equation (Page-44), Fluctuations and Diffusion (Page-50), Features of Hot-Electron Fluctuation Spectra (Page-62), Experimental Techniques (Page-81), Hot-Electron Microwave Noise in Elementary Semiconductors (Page-96), Hot-Electron Microwave Noise in GaAs and InP (Page-116), Length-Dependent Hot-Electron Noise (Page-128), Hot-Electron Noise in Doped Semiconductors: Theory (Page-147), Electronic Noise in Standard-Doped n-Type GaAs (Page-161), Electron Diffusion in Standard-Doped n-Type GaAs (Page-175), Electronic Subbands in Quantum Wells (Page-181Hot-Electron Noise in ALGaAs/GaAs 2DEG Channels (Page-197), Hot-Electron Noise in InP-Based 2DEG Channels (Page-209), Cutoff Frequencies of Fast and Ultrafast Processes (Page-220), Spatially Inhomogeneous Fluctuations (Page-230), Monte Carlo Approach to Microwave Noise in Devices (Page-245),
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