Pattern classification / Richard O. Duda, Peter E. Hart, David G. Stork.
Material type:
TextPublisher: New York : Wiley, c2001Edition: 2nd edDescription: xx, 654 p. : ill. ; 27 cmISBN: 0471056693 (alk. paper)Subject(s): Pattern recognition systems | Statistical decisionDDC classification: 006.4,DUD LOC classification: Q327 | .D83 2001Online resources: Contributor biographical information | Publisher description | Table of Contents
Contents:
Introduction (Page-1), Bayesian Decision theory (Page-20), Maximum-Likelihood and Bayesian Parameter estimation (Page-84), Non parametric technique (Page-161), Liner Discriminant Functions (Page-213), Multi layer Neural Networks (Page-282), Stochastic Method (Page-350), Non metric Methods (Page-394), Algorithm-Independent Machine Learning (Page-453), Unsupervised Learning and Clustering (Page-517).
| Item type | Current location | Home library | Shelving location | Call number | Status | Notes | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|---|
Book
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Military College of Signals (MCS) | Military College of Signals (MCS) | General Stacks | 006.4,DUD (Browse shelf) | Available | Almirah No.7, Shelf No.4 | MCS33217 |
Total holds: 0
Introduction (Page-1), Bayesian Decision theory (Page-20), Maximum-Likelihood and Bayesian Parameter estimation (Page-84), Non parametric technique (Page-161), Liner Discriminant Functions (Page-213), Multi layer Neural Networks (Page-282), Stochastic Method (Page-350), Non metric Methods (Page-394), Algorithm-Independent Machine Learning (Page-453), Unsupervised Learning and Clustering (Page-517).
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