Fundamentals of modern VLSI devices / Yuan Taur, Tak H. Ning.
Publisher: Cambrige, UK ; New York : Cambridge University Press, 1998Description: xxii, 469 p. : ill. ; 26 cmISBN: 0521550564; 0521559596 (pbk.)Subject(s): Bipolar transistors | Integrated circuits -- Very large scale integration | Metal oxide semiconductors, ComplementaryDDC classification: 621.395,TAU Online resources: Publisher description | Table of contents
Contents:
Introduction (Page-1), Basic Device Physics (Page-9), Mosfet Devices (Page-112), CMOS Device Design (Page-164), CMOS Performance Factors (Page-224), Bipolar Devices (Page-292), Bipolar Device Design (Page-351), Bipolar Performance Factors (Page-379).
| Item type | Current location | Home library | Shelving location | Call number | URL | Status | Notes | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|---|---|
Book
|
Military College of Signals (MCS) | Military College of Signals (MCS) | General Stacks | 621.395,TAU (Browse shelf) | Link to resource | Available | Almirah No.40, Shelf No.4 | MCS30652 |
Total holds: 0
Introduction (Page-1), Basic Device Physics (Page-9), Mosfet Devices (Page-112), CMOS Device Design (Page-164), CMOS Performance Factors (Page-224), Bipolar Devices (Page-292), Bipolar Device Design (Page-351), Bipolar Performance Factors (Page-379).
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