Recombination lifetime measurements in silicon
Material type:
TextPublisher: USA ASTM 1998Description: 392PISBN: 0-8031-2489-9Subject(s): SEMICONDUCTORS TESTING CONGRESSES, SERVICE LIFE CONGRESSESDDC classification: 621.38152 REC
| Item type | Current location | Home library | Shelving location | Call number | Status | Date due | Barcode | Item holds |
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College of Electrical & Mechanical Engineering (CEME) | College of Electrical & Mechanical Engineering (CEME) | General Stacks | 621.38152 REC (Browse shelf) | Available | CEME-37400 | ||
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Book
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College of Electrical & Mechanical Engineering (CEME) | College of Electrical & Mechanical Engineering (CEME) | General Stacks | 621.38152 REC (Browse shelf) | Available | CEME-37401 | ||
|
Book
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College of Electrical & Mechanical Engineering (CEME) | College of Electrical & Mechanical Engineering (CEME) | General Stacks | 621.38152 REC (Browse shelf) | Available | CEME-38702 |
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