Integrated circuit test engineering, modern techniques
Material type:
TextPublisher: DELHI SPRINGER 2009Description: XXX,362PISBN: 9788184890297Subject(s): INTEGRATED CIRCUIT TEST ENGINEERING.CIRCUIT TEST ENGINEERINGDDC classification: 621.3 GRO
| Item type | Current location | Home library | Shelving location | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
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College of Electrical & Mechanical Engineering (CEME) | College of Electrical & Mechanical Engineering (CEME) | General Stacks | 621.3 GRO (Browse shelf) | Available | CEME-44874 |
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