BUILT IN TEST FOR VLSI, PSEUDORANDOM TECHNIQUES
Material type:
TextPublisher: NWEWYORK JOHN WILEY 1987Description: 354PISBN: 0-471-62463-2Subject(s): INTEGRATED CIRCUITS VERY LARGE SCALE INTEGRATION TESTINGDDC classification: 621.38173 BAR'B
| Item type | Current location | Home library | Shelving location | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Book
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College of Electrical & Mechanical Engineering (CEME) | College of Electrical & Mechanical Engineering (CEME) | General Stacks | 621.38173 BAR'B (Browse shelf) | Available | CEME-27866 |
Total holds: 0
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