Yield and reliability in microwave circuit and system design
Material type:
TextPublisher: BOSTON ARTECH HOUSE 1993Description: 276PISBN: 0-89006-527-6Subject(s): COMPLETE AIDED DESIGN ENGINEERING DESIGN STATISTICAL METHOD MICROWAVES INTEGRATED CIRCUIT DESIGN AND CONSTRUCTION STATISTICAL METHODDDC classification: 621.38152 MEE'Y
| Item type | Current location | Home library | Shelving location | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|---|
Book
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College of Electrical & Mechanical Engineering (CEME) | College of Electrical & Mechanical Engineering (CEME) | General Stacks | 621.38152 MEE'Y (Browse shelf) | Available | CEME-30412 |
Total holds: 0
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