Electromigration and electronic device degradation
Material type:
TextPublisher: NEWYORK JOHN WILEY 1994Description: XIV, 343PISBN: 0-471-58489-4Subject(s): INTEGRATED CIRCUITS DETERIORATION SEMICONDUCTORSDDC classification: 621.3815 ELE'C
| Item type | Current location | Home library | Shelving location | Call number | Status | Date due | Barcode | Item holds |
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Book
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College of Electrical & Mechanical Engineering (CEME) | College of Electrical & Mechanical Engineering (CEME) | General Stacks | 621.3815 ELE'C (Browse shelf) | Available | CEME-32678 | ||
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Book
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College of Electrical & Mechanical Engineering (CEME) | College of Electrical & Mechanical Engineering (CEME) | General Stacks | 621.3815 ELE'C (Browse shelf) | Available | CEME-31750 |
Total holds: 0
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