NUST Institutions Library Catalogue catalog › Results of search for 'ccl=se,phr:"The Morgan Kaufmann series in systems on silicon"'

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		VLSI test principles and architectures: design for testability design for testability edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen by Wang, Laung-Terng \| Wu, Cheng-Wen \| Wen, Xiaoqing. Publisher: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006Other title: VLSI test principles and architectures.Availability: Items available for loan: Central Library (CL)Call number: 621.395 WAN (1). Place hold Find in NUST Repository
		Networks on chips: technology and tools technology and tools Luca Benini and Giovanni De Micheli by Benini, Luca \| De Micheli, Giovanni. Publisher: Amsterdam ; Boston : Elsevier Morgan Kaufmann Publishers, c2006Availability: Items available for loan: Central Library (CL)Call number: 004.6 BEN (2). Place hold Find in NUST Repository
		ASIC and FPGA verification: a guide to component modeling a guide to component modeling Richard Munden. by Munden, Richard. Publisher: Amsterdam ; Boston : Elsevier, Morgan Kaufmann Publishers, c2005Availability: Items available for loan: Central Library (CL)Call number: 621.3815 MUN (1). Place hold Find in NUST Repository