| 000 | 01001cam a22002294a 4500 | ||
|---|---|---|---|
| 008 | 031015s2004 njua b 001 0 eng | ||
| 020 | _a047143308X | ||
| 040 |
_aDLC _cDLC _dDLC _dDLC |
||
| 082 | 0 | 0 |
_a621.38224 _222 |
| 100 | 1 | _aMontrose, Mark I. | |
| 245 | 1 | 0 |
_aTesting for EMC compliance: approaches and techniques _bapproaches and techniques / _cMark I. Montrose, Edward M. Nakauchi. |
| 260 |
_aHoboken, NJ : _bJohn Wiley, _c2004. |
||
| 300 |
_axviii, 460 p. : _bill. ; _c24 cm. |
||
| 504 | _aIncludes bibliographical references (p. 447-451) and index. | ||
| 650 | 0 | _aElectromagnetic compatibility. | |
| 650 | 0 | _aElectromagnetic interference. | |
| 700 | 1 | _aNakauchi, Edward M. | |
| 856 | 4 | 2 |
_3Contributor biographical information _uhttp://www.loc.gov/catdir/bios/wiley046/2003063488.html |
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/description/wiley041/2003063488.html |
| 856 | 4 | 1 |
_3Table of contents _uhttp://www.loc.gov/catdir/toc/wiley041/2003063488.html |
| 942 |
_2ddc _cBK |
||
| 999 |
_c11548 _d11548 |
||