000 01238cam a22003377a 4500
001 8576270
005 20170105102350.0
006 m d
007 cr n
008 100927s2010 nyua sb 001 0 eng d
016 7 _a015760224
_2Uk
020 _a9781441969224 (alk. paper)
020 _a1441969225 (alk. paper)
020 _a9781441969231 (eISBN
035 _a(WaSeSS)ssj0000450115
040 _aBTCTA
_beng
_cBTCTA
_dYDXCP
_dCDX
_dJHE
_dGZQ
_dVRC
_dUKMGB
_dDLC
_dWaSeSS
042 _alccopycat
082 0 4 _a519.23
_222
100 1 _aStreit, Roy L.
210 1 0 _aPoisson point processes
245 1 0 _aPoisson point processes: imaging, tracking and sensing
_bimaging, tracking and sensing
_cRoy L. Streit.
260 _aNew York :
_bSpringer,
_cc2010.
300 _axiii, 273 p.
_c24 cm.
504 _aIncludes bibliographical references (p. 265-270) and index.
506 _aLicense restrictions may limit access.
650 0 _aPoisson processes.
773 0 _tSpringerLink ebooks - Engineering (2010)
856 4 0 _uhttp://www.columbia.edu/cgi-bin/cul/resolve?clio8576270
_zFull text available from SpringerLink ebooks - Engineering (2010)
910 _aLibrary of Congress record
942 _2ddc
_cBK
999 _c11881
_d11881