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020 _a9780863417566
035 _a(OCoLC)ocn505834125
035 _a(OCoLC)505834125
_z(OCoLC)781852672
035 _a(NNC)9412355
037 _bKnovel Corporation
_nhttp://www.knovel.com
040 _aN$T
_beng
_cN$T
_dOCLCQ
_dIDEBK
_dOCLCQ
_dKNOVL
050 4 _aTK6553
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072 7 _aCOM
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072 7 _aTEC
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082 0 4 _a621.382240287
_222
100 1 _aMorgan, David.
245 1 2 _aA handbook for EMC testing and measurement
_cDavid Morgan.
250 _aPbk. ed.
260 _aLondon :
_bInstitution of Electrical Engineers,
_c2007.
300 _a(xiv, 290 p.) :
_bill.
490 1 _aIEE electrical measurement series ;
_v8
504 _aIncludes bibliographical references and index.
650 0 _aElectromagnetic compatibility
_xTesting
_vHandbooks, manuals, etc.
650 0 _aElectronic apparatus and appliances
_vHandbooks, manuals, etc.
650 7 _aCOMPUTERS
_xInformation Theory.
_2bisacsh
650 7 _aTECHNOLOGY & ENGINEERING
_xSignals & Signal Processing.
_2bisacsh
650 7 _aCompatibilité électromagnétique.
_2ram
653 0 _aElectromagnetic compatibility
655 4 _aElectronic books.
710 2 _aInstitution of Electrical Engineers.
776 0 8 _iPrint version:
_aMorgan, David.
_tHandbook for EMC testing and measurement.
_dLondon : Institution of Electrical Engineers, 2007
_z9780863417566
830 0 _aIEE electrical measurement series ;
_v8.
856 4 0 _uhttp://www.columbia.edu/cgi-bin/cul/resolve?clio9412355
_3Knovel
942 _2ddc
_cBK
999 _c13089
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