000			01368 a2200265 4500
003			Nust
005			20220802102047.0
010			_a 99057532
020			_a0471349410 (alk. paper)
040			_cNust
082	0	0	_a620.0045,RIG
100	1		_aRigdon, Steven E., _996218
245	1	0	_aStatistical methods for the reliability of repairable systems / _cSteven E. Rigdon, Asit P. Basu.
260			_aNew York : _bWiley, _c2000.
300			_axii, 281 p. : _bill. ; _c25 cm.
440		0	_aWiley series in probability and statistics _911039
505			_aTerminology and Notation for Repairable Systems (Page-1), Probabilistic Models: The Poisson Process (Page-33), Probabilistic Medals: Renewal and Other Processes (Page-65), Analyzing Data from a Signal Repairable System (Page-87), Analyzing Data from Multiple Repairable Systems (Page-181), Appendix a Tables (Page-229).
650		0	_aMaintainability (Engineering) _xStatistical methods. _996219
650		0	_aReliability (Engineering) _xStatistical methods. _955533
700	1		_aBasu, Asit P. _996220
856	4	2	_3Contributor biographical information _uhttp://www.loc.gov/catdir/bios/wiley043/99057532.html
856	4	2	_3Publisher description _uhttp://www.loc.gov/catdir/description/wiley035/99057532.html
856	4	2	_3Table of Contents _uhttp://www.loc.gov/catdir/toc/onix06/99057532.html
942			_cREF _2ddc
999			_c175504 _d175504