000 01135 a2200205 4500
003 Nust
005 20220803170653.0
010 _a 93019595
020 _a0070376026 (H) :
040 _cNust
082 0 0 _a621.380287,LEN
100 1 _aLenk, John D.
_957741
245 1 0 _aMcGraw-Hill electronic testing handbook :
_bprocedures and techniques /
_cJohn D. Lenk.
260 _aNew York :
_bMcGraw-Hill,
_cc1994.
300 _axvii, 397 p. :
_bill. ;
_c24 cm.
505 _aElectronic Meters (Page-1), Oscilloscope (Page-75), Generators (Page-139), Electronic Counters And Frequency Standards (Page-181), Probes And Transducers (Page-191), Special Purpose Test Equipment (Page-203), Two-Junction (Page-219), Field Effect Transistors (Page-235), Unijunction And Programmable UJT Tests (Page-261), Solid State Diode Tests (Page-279), Thyristor And Control Rectifier Tests (Page-295), Audio And Op-Amp Tests (Page-317), Power Supply Tests (Page-339), Radio Frequency Tests (Page-351), Communications Equipment Tests (Page-369).
650 0 _aTelecommunication Engineering.
740 0 _aElectronic testing handbook.
942 _cREF
_2ddc
999 _c175656
_d175656