000 01044 a2200241 4500
003 Nust
005 20220818192613.0
010 _a 99015000
020 _a0824760034 (alk. paper)
040 _cNust
082 0 0 _a621.3827,SIR
100 1 _aSirohi, R. S.
_998142
245 1 0 _aOptical methods of measurement :
_bwholefield techniques /
_cRajpal S. Sirohi, Fook Siong Chau.
260 _aNew York :
_bMarcel Dekker,
_c1999.
300 _axiv, 323 p. :
_bill. ;
_c25 cm.
490 1 _aOptical engineering ;
_vv. 65
505 _aWaves (Page-1), Diffraction (Page-17), Phase Evaluation Methods (Page-33), Detectors and Recording Materials (Page-50) ,Holographic Interferon (Page-77), Speckle Metro logy (Page-127), Photoelectric (Page-183), The Moire Phenomenon (Page-227).
650 0 _aTelecommunication engineering
700 1 _aChau, F. S.
_998143
830 0 _aOptical engineering (Marcel Dekker, Inc.) ;
_996335
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/enhancements/fy0647/99015000-d.html
942 _cREF
_2ddc
999 _c176000
_d176000