000			01422 a2200241 4500
003			Nust
005			20221125093007.0
010			_a 89002844
020			_a0023781408
040			_cNust
082	0	0	_a621.38131,MAY
100	1		_aMayer, James W., _9103554
245	1	0	_aElectronic materials science : _bfor integrated circuits in Si and GaAs / _cJames W. Mayer, S.S. Lau.
260			_aNew York : _bMacmillan ; _aLondon : _bCollier Macmillan, _cc1990.
300			_axx, 476 p. : _bill. ; _c25 cm.
505			_aIntegrated Circuits (Page-1), Current Flow and Capacitance (Page-27), Band, Bonds and Semiconductor (Page-51), Barriers and Junctions (Page-82), Transistor Bipolar and Field Effect (Page-111), Crystallography and Crystalline Defects (Page-142), Diffusion in Solids (Page-183), Ion Implantation (Page-222), Thermal Oxidation of Silicon and Chemical Vapor Deposition (Page-251), Metallization and Phase Diagrams (Page-276), Reaction Kinetics Sillicides, Aluminides ad Diffusion Barriers (Page-306), Energy Bands and Wave Behavior (Page-340), Transistor and Laser (Page-375), Assembly and Packing (Page-440),
650		0	_aIntegrated circuits _xDesign and construction. _935781
650		0	_aIntegrated circuits _xMaterials. _9103555
650		0	_aTransistor circuits _xDesign and construction. _9103556
650		0	_aTransistor circuits _xMaterials. _9103557
700	1		_aLau, S. S. _9103558
942			_2ddc _cBK
999			_c181925 _d181925