000			01099 a2200205 4500
003			Nust
005			20230802133216.0
010			_a 86003005
020			_a0070653410 :
040			_cNust
082	0	0	_a621.395,TSU
100	1		_aTsui, Frank F. _994517
245	1	0	_aLSI/VLSI testability design / _cFrank F. Tsui.
260			_aNew York : _bMcGraw-Hill, _cc1987.
300			_axv, 702 p. : _bill. ; _c24 cm.
505			_aIntroduction (Page-1), Conventional Test Methods (Page-31), Problems In Testing (Page-52), Design For Testability (Page-75), Latch Scanning Arrangements (Page-102), Switching Of Input/ Output Ports (Page-136), Internal Pattern Generation And Response Compaction (Page-169), Isolation And Self Sufficiency (Page-213), Software And Equipment Supports (Page-260), Taking Stock And Looking Ahead (Page-313), A Penny For My Thoughts (Page-394), Future Of Test Engineering (Page-447).
650		0	_aIntegrated circuits _xLarge scale integration _xTesting. _9113895
650		0	_aIntegrated circuits _xVery large scale integration _xTesting. _9113896
942			_2ddc _cBK _k621.395,TSU
999			_c183885 _d183885