000			00731 a2200169 4500
003			Nust
005			20221207190109.0
040			_cNust
082			_a621.38153,WIL
100			_aB.R Wilkins _9104396
245			_aTesting Digital Circuits an Introduction / _cB.R Wilkins
260			_aUK _bVan Nostrand Reinhold _c1986
300			_a196p
505			_aTesting In Context (Page-1), Test-Pattern Generators (Page-21), Aids To Test Pattern Generators (Page-43), Faults Diagrams (Page-55), Testing Sequential Logic(Page-76), Testing MSI and LSI Devices (Page-97), Enhancing Testability (Page-122), Designing Of Testability (Page-139), Self-Testing Circuits (Page-158).
650			_aTelecommunication Engineering
942			_2ddc _cBK
999			_c193549 _d193549