000 00254 a2200097 4500
001 52596
100 _aHowes M J
245 _aReliability and Degradation (Semiconductor Devices & Circuits)
260 _aNew York
_bJohn Wiley
_c
090 _c33083
_d33083
942 _aNUST-CAE
_cM
_c25651
999 _c287669
_d287669