000 01186pam a2200289 a 4500
001 2958691
003 Nust- CAS-E0
005 20180118181354.0
008 910401s1992 nyua b 001 0 eng
010 _a 91003507
020 _a0024215759
040 _aDLC
_cDLC
_dDLC
050 0 0 _aQC176.9.M84
_bT83 1992
082 0 0 _a621.381/52
_220
100 1 _aTu, K. N.
_q(King-ning),
_d1937-
245 1 0 _aElectronic thin film science :
_bfor electrical engineers and materials scientists /
_cKing-Ning Tu, James W. Mayer, Leonard C. Feldman ; [illustrations provided by the authors].
260 _aNew York :
_bMacmillan ;
_aToronto :
_bMaxwell Macmillan Canada ;
_aNew York :
_bMaxwell Macmillan International,
_cc1992.
300 _axvii, 428 p. :
_bill. ;
_c25 cm.
504 _aIncludes bibliographical references and index.
650 0 _aThin films, Multilayered.
650 0 _aElectrical engineering
_xMaterials.
700 1 _aMayer, James W.,
_d1930-
700 1 _aFeldman, Leonard C.
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2ddc
_cBK
999 _c355241
_d355241