000 01384pam a2200337 a 4500
999 _c478357
_d478357
001 2031293
003 NUST
005 20180523050404.0
008 920401s1992 maua be 001 0 eng
010 _a 92014999
020 _a0750691689
038 _aSNS Library
040 _aDLC
_cDLC
_dDLC
050 0 0 _aTA418.7
_b.B73 1992
082 0 0 _a620.44
_220
100 _aC. Richard Brundle
_910454
245 0 0 _aEncyclopedia of materials characterization :
_bsurfaces, interfaces, thin films /
_ceditors, C. Richard Brundle, Charles A. Evans, Jr., Shaun Wilson ; managing editor, Lee E. Fitzpatrick.
260 _aBoston :
_bButterworth-Heinemann ;
_aGreenwich, CT :
_bManning,
_cc1992.
300 _axix, 751 p. :
_bill. ;
_c25 cm.
440 0 _aMaterials characterization series
_910455
504 _aIncludes bibliographical references and index.
650 0 _aSurfaces (Technology)
_xTesting.
_910456
700 1 _aBrundle, C.R.
_910457
700 1 _aEvans, Charles A.
_910458
700 1 _aWilson, Shaun.
_910459
856 4 2 _3Publisher description
_uhttp://www.loc.gov/catdir/description/els032/92014999.html
856 4 1 _3Table of contents
_uhttp://www.loc.gov/catdir/toc/els032/92014999.html
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2ddc
_cBK