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| 003 | CEME | ||
| 005 | 20210628202637.0 | ||
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| 020 | _a0-8031-2489-9 | ||
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| 082 | _a621.38152 REC | ||
| 100 |
_aGupta, Dinesh C Bacher, F.R Hughes, W.M _960868 |
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| 245 | _aRecombination lifetime measurements in silicon | ||
| 260 |
_aUSA _bASTM _c1998 |
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| 300 | _a392P | ||
| 650 |
_aSEMICONDUCTORS TESTING CONGRESSES, SERVICE LIFE CONGRESSES _960869 |
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_cBK _2ddc |
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_c570488 _d570488 |
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