000 01113pam a2200277 a 4500
001 1106621
003 NUST-PNEC
005 20170116180706.0
008 930409s1994 nyua f 001 0 eng
010 _a 93019595
020 _a0070376026
040 _aDLC
_cPNEC
050 0 0 _aTK7878.4
_b.L4514 1994
082 0 0 _a621.38028 LEN
_220
100 1 _aLenk, John D.
245 1 0 _aMcGraw-Hill electronic testing handbook :
_bprocedures and techniques /
_cJohn D. Lenk.
260 _aNew York :
_bMcGraw-Hill,
_cc1994.
300 _axvii, 397 p. :
_bill. ;
_c24 cm.
500 _aIncludes index. http://www.amazon.com/s/ref=nb_sb_noss?url=search-alias%3Dstripbooks&field-keywords=0070376026&rh=n%3A283155%2Ck%3A0070376026&ajr=2
650 0 _aElectronic instruments
_xHandbooks, manuals, etc.
650 0 _aElectronic apparatus and appliances
_xTesting
_xEL, EE
740 0 _aElectronic testing handbook.
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2ddc
_cBK
999 _c60747
_d60747