| 000 | 01258cam a22003014a 4500 | ||
|---|---|---|---|
| 001 | 12021219 | ||
| 003 | NUST - PNEC | ||
| 005 | 20170116181017.0 | ||
| 008 | 000525s2001 nyua b 001 0 eng | ||
| 010 | _a 00042770 | ||
| 020 | _a0195140168 | ||
| 040 | _cLIBRARY | ||
| 082 | 0 | 0 | _a621.3815 BUR |
| 100 | 1 |
_aBurns, Mark, _d1962- |
|
| 245 | 1 | 3 |
_aAn introduction to mixed-signal IC test and measurement / _cMark Burns, Gordon W. Roberts. |
| 260 |
_aNew York : _bOxford University Press, _cc2001. |
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| 300 |
_axx, 684 p. : _bill. ; _c25 cm. |
||
| 440 | 4 | _aThe Oxford series in electrical and computer engineering | |
| 504 | _aIncludes bibliographical references and index. | ||
| 650 | 0 |
_aIntegrated circuits _xTesting. |
|
| 650 | 0 |
_aMixed signal circuits _xEL |
|
| 700 | 1 |
_aRoberts, Gordon W., _d1959- |
|
| 856 | 4 | 2 |
_3Publisher description _uhttp://www.loc.gov/catdir/enhancements/fy0610/00042770-d.html |
| 856 | 4 | 1 |
_3Table of contents only _uhttp://www.loc.gov/catdir/enhancements/fy0610/00042770-t.html |
| 906 |
_a7 _bcbc _corignew _d1 _eocip _f20 _gy-gencatlg |
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| 942 |
_2ddc _cBK |
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| 999 |
_c67299 _d67299 |
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